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1

Family Relationships in Shakespeare and the Restoration Comedy of Manners.by Sarup Singh

Review by: James J. Stathis

Journal:

Shakespeare Quarterly

Year:

1986

Language:

english

File:

PDF, 325 KB

english, 1986

2

Ultrafast Measurements and Physical Modeling of NBTI Stress and Recovery in RMG FinFETs Under Diverse DC–AC Experimental Conditions

Parihar, Narendra, Sharma, Uma, Southwick, Richard G., Wang, Miaomiao, Stathis, James H., Mahapatra, Souvik

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 6.30 MB

english, 2018

3

[IEEE 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Hsinchu (2015.6.29-2015.7.2)] 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits - Low-κ and High-κ breakdown statistics with variability: Clustering model versus reconstruction methodology (Invited)

Wu, Ernest, Baozhen Li,, Stathis, James

Year:

2015

Language:

english

File:

PDF, 4.98 MB

english, 2015

4

[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - The effect of interface thickness of high-k/metal gate stacks on NFET dielectric reliability

Linder, Barry P., Cartier, Eduard, Krishnan, Siddarth, Stathis, James H., Kerber, Andreas

Year:

2009

Language:

english

File:

PDF, 250 KB

english, 2009

5

Superior PBTI Reliability for SOI FinFET Technologies and Its Physical Understanding

Wang, Miaomiao, Muralidhar, Ramachandran, Stathis, James H., Linder, Barry Paul, Jagannathan, Hemanth, Faltermeier, Jonathan

Journal:

IEEE Electron Device Letters

Year:

2013

Language:

english

File:

PDF, 501 KB

english, 2013

6

[IEEE 2014 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2014.12.15-2014.12.17)] 2014 IEEE International Electron Devices Meeting - Multiple breakdown phenomena and modeling for non-uniform dielectric systems

Wu, Ernest, Baozhen Li,, Stathis, James H., Achanta, Ravi

Year:

2014

Language:

english

File:

PDF, 577 KB

english, 2014

7

The end of the assembly line: Shifting patterns of automotive burns

Yon, James R., Fredericks, Charles, Mentzer, Caleb, Kubasiak, John C., Poulakidas, Stathis

Journal:

Year:

2020

File:

PDF, 534 KB

2020

8

[IEEE 2012 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA, USA (2012.04.15-2012.04.19)] 2012 IEEE International Reliability Physics Symposium (IRPS) - Bias temperature instability in High-κ/metal gate transistors - Gate stack scaling trends

Krishnan, Siddarth, Narayanan, Vijay, Cartier, Eduard, Ioannou, Dimitris, Zhao, Kai, Ando, Takashi, Kwon, Unoh, Linder, Barry, Stathis, James, Chudzik, Michael, Kerber, Andreas, Choi, Kisik

Year:

2012

Language:

english

File:

PDF, 301 KB

english, 2012

9

Processes of behavior change and weight loss in a theory-based weight loss intervention program: a test of the process model for lifestyle behavior change

Gillison, Fiona, Stathi, Afroditi, Reddy, Prasuna, Perry, Rachel, Taylor, Gordon, Bennett, Paul, Dunbar, James, Greaves, Colin

Journal:

International Journal of Behavioral Nutrition and Physical Activity

Year:

2015

Language:

english

File:

PDF, 696 KB

english, 2015

10

[ECS 215th ECS Meeting - San Francisco, CA (May 24 - May 29, 2009)] ECS Transactions - The Dielectric Breakdown in Gate Oxides under High Field Stress

Lombardo, Salvatore A., Stathis, James H., Bersuker, Gennadi

Year:

2009

Language:

english

File:

PDF, 755 KB

english, 2009

11

Guest Comment: Downsizing physics for the 90s

Stathis, James H.

Journal:

American Journal of Physics

Year:

1994

Language:

english

File:

PDF, 378 KB

english, 1994

12

Impacts of NBTI and PBTI on SRAM static/dynamic noise margins and cell failure probability

Aditya Bansal, Rahul Rao, Jae-Joon Kim, Sufi Zafar, James H. Stathis, Ching-Te Chuang

Journal:

Microelectronics Reliability

Year:

2009

Language:

english

File:

PDF, 1.76 MB

english, 2009

13

Book reviews

Jones, W., Brown, James Robert, Mander, W. J., Krajewski, Władysław, Preston, John M., Psillos, Stathis, Hawley, Katherine, Taylor, John

Journal:

International Studies in the Philosophy of Science

Year:

1995

Language:

english

File:

PDF, 2.44 MB

english, 1995

14

The aggressive child

Scott, James G, Tunbridge, Michael, Stathis, Stephen

Journal:

Journal of Paediatrics and Child Health

Year:

2018

Language:

english

File:

PDF, 122 KB

english, 2018

15

[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Elapsed-time statistics of successive breakdown in the presence of variability for dielectric breakdown in BEOL/MOL/FEOL applications

Wu, Ernest Y., Kim, Andrew, Li, Baozhen, Stathis, James H.

Year:

2018

Language:

english

File:

PDF, 1.71 MB

english, 2018

16

Dielectric breakdown mechanisms in gate oxides

Lombardo, Salvatore, Stathis, James H., Linder, Barry P., Pey, Kin Leong, Palumbo, Felix, Tung, Chih Hang

Journal:

Journal of Applied Physics

Year:

2005

Language:

english

File:

PDF, 2.55 MB

english, 2005

17

The yield of postmortem genetic testing in sudden death cases with structural findings at autopsy

Lahrouchi, Najim, Raju, Hariharan, Lodder, Elisabeth M., Papatheodorou, Stathis, Miles, Chris, Ware, James S., Papadakis, Michael, Tadros, Rafik, Cole, Della, Skinner, Jonathan R., Crawford, Jackie, L

Journal:

European Journal of Human Genetics

Year:

2019

Language:

english

File:

PDF, 794 KB

english, 2019

18

[IEEE 2014 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2014.4.28-2014.4.30)] Technical Papers of 2014 International Symposium on VLSI Design, Automation and Test - The resilience wall: Cross-layer solution strategies

Mitra, Subhasish, Bose, Pradip, Cheng, Eric, Cher, Chen-Yong, Cho, Hyungmin, Joshi, Rajiv, Kim, Young Moon, Lefurgy, Charles R., Li, Yanjing, Rodbell, Kenneth P., Skadron, Kevin, Stathis, James, Szafa

Year:

2014

Language:

english

File:

PDF, 25.24 MB

english, 2014

19

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Time-dependent clustering model versus combination-based approach for BEOL/MOL and FEOL non-uniform dielectric breakdown: Similarities and disparities

Wu, Ernest Y., Li, Baozhen, Stathis, James H., LaRow, Charles

Year:

2014

Language:

english

File:

PDF, 673 KB

english, 2014

20

[IEEE 2014 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2014.12.15-2014.12.17)] 2014 IEEE International Electron Devices Meeting - Reliability challenges for the 10nm node and beyond

Stathis, James H., Wang, M., Southwick, R.G., Wu, E.Y., Linder, B.P, Liniger, E.G., Bonilla, G., Kothari, H.

Year:

2014

Language:

english

File:

PDF, 414 KB

english, 2014

21

[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - A critical analysis of sampling-based reconstruction methodology for dielectric breakdown systems (BEOL/MOL/FEOL)

Wu, Ernest, Stathis, James, Li, Baozhen, Linder, Barry, Zhao, Kai, Bonilla, Griselda

Year:

2015

Language:

english

File:

PDF, 1.78 MB

english, 2015

22

Controversial issues in negative bias temperature instability

Stathis, James H., Mahapatra, Souvik, Grasser, Tibor

Journal:

Microelectronics Reliability

Year:

2018

Language:

english

File:

PDF, 460 KB

english, 2018

23

Damage control hip disarticulation: two-stage operation with index creation of a large medial flap for the septic hip

Colosimo, Christina, Fredericks, Charles, Yon, James R, Kubasiak, John C, Bokhari, Faran, Poulakidas, Stathis

Journal:

Trauma Surgery & Acute Care Open

Year:

2020

File:

PDF, 1.10 MB

2020

24

Recovery study of negative bias temperature instability

Miaomiao Wang, Sufi Zafar, James H. Stathis

Journal:

Microelectronic Engineering

Year:

2009

Language:

english

File:

PDF, 379 KB

english, 2009

25

[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - The physics of NBTI: What do we really know?

Stathis, James H.

Year:

2018

Language:

english

File:

PDF, 310 KB

english, 2018

26

Hydrogen Electrochemistry and Stress-Induced Leakage Current in Silica

Blöchl, Peter E., Stathis, James H.

Journal:

Physical Review Letters

Year:

1999

Language:

english

File:

PDF, 116 KB

english, 1999

27

[IEEE 2017 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2017.4.2-2017.4.6)] 2017 IEEE International Reliability Physics Symposium (IRPS) - Comparison of DC and AC NBTI kinetics in RMG Si and SiGe p-FinFETs

Parihar, Narendra, Southwick, Richard G., Sharma, Uma, Wang, Miaomiao, Stathis, James H, Mahapatra, Souvik

Year:

2017

Language:

english

File:

PDF, 318 KB

english, 2017

28

Modeling of NBTI Kinetics in Replacement Metal Gate Si and SiGe FinFETs--Part-II: AC Stress and Recovery

Parihar, Narendra, Southwick, Richard G., Wang, Miaomiao, Stathis, James H., Mahapatra, Souvik

Journal:

IEEE Transactions on Electron Devices

Year:

2018

Language:

english

File:

PDF, 2.16 MB

english, 2018

29

Obesity is Not Associated With Need for Skin Grafting After Hidradenitis Excision

Colosimo, Christina, Yon, James R., Fredericks, Charles, Kingsley, Samuel, Gupta, Sameer, Mentzer, Caleb J., Bokhari, Faran, Poulakidas, Stathis

Journal:

The American surgeon

Year:

2020

File:

PDF, 276 KB

2020

30

[IEEE 2011 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2011.04.10-2011.04.14)] 2011 International Reliability Physics Symposium - Analysis of recoverable and non-recoverable NBTI and PBTI using AC and DC stresses

Monsieur, Frederic, Cartier, Eduard, Stathis, James

Year:

2011

Language:

english

File:

PDF, 610 KB

english, 2011

31

[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - Separation of interface states and electron trapping for hot carrier degradation in ultra-scaled replacement metal gate n-FinFET

Wang, Miaomiao, Liu, Zuoguang, Yamashita, Tenko, Stathis, James H., Chen, Chia-yu

Year:

2015

Language:

english

File:

PDF, 1.21 MB

english, 2015

32

[IEEE 2012 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA, USA (2012.10.14-2012.10.18)] 2012 IEEE International Integrated Reliability Workshop Final Report - Keynote Address: Device reliability physics: Past, present, and future

Year:

2012

File:

PDF, 117 KB

2012

33

Waste the waist: a pilot randomised controlled trial of a primary care based intervention to support lifestyle change in people with high cardiovascular risk

Greaves, Colin, Gillison, Fiona, Stathi, Afroditi, Bennett, Paul, Reddy, Prasuna, Dunbar, James, Perry, Rachel, Messom, Daniel, Chandler, Roger, Francis, Margaret, Davis, Mark, Green, Colin, Evans, Ph

Journal:

International Journal of Behavioral Nutrition and Physical Activity

Year:

2015

Language:

english

File:

PDF, 833 KB

english, 2015

34

[ECS 208th ECS Meeting - Los Angeles, California (October 16-October 21, 2005)] ECS Transactions - Charge Trapping & NBTI in High k Gate Dielectric Stacks

Zafar, Sufi, Callegari, Alessando, Stathis, James

Year:

2006

Language:

english

File:

PDF, 211 KB

english, 2006

35

Australian national trends in stimulant dispensing: 2002–2009

Hollingworth, Samantha A., Nissen, Lisa M., Stathis, Stephen S., Siskind, Dan J., Varghese, John M. N., Scott, James G.

Journal:

Australian and New Zealand Journal of Psychiatry

Year:

2011

Language:

english

File:

PDF, 280 KB

english, 2011

36

Introduction to the Special Issue on the 50th International Reliability Physics Symposium

Ogawa, Ennis T., Chaparala, Prasad, Stathis, James H., Krishnan, Srikanth

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2013

Language:

english

File:

PDF, 40 KB

english, 2013

37

Three Books on Restoration and Eighteenth-Century Drama

Review by: James J. Stathis

Journal:

Shakespeare Quarterly

Year:

1983

Language:

english

File:

PDF, 338 KB

english, 1983

38

Dietary flaxseed prevents radiation-induced oxidative lung damage, inflammation and fibrosis in a mouse model of thoracic radiation injury

Lee, James C, Krochak, Ryan, Blouin, Aaron, Kanterakis, Stathis, Chatterjee, Shampa, Arguiri, Evguenia, Vachani, Anil, Solomides, Charalambos C, Cengel, Keith A, Christofidou-Solomidou, Melpo

Journal:

Cancer Biology & Therapy

Year:

2009

Language:

english

File:

PDF, 1.67 MB

english, 2009

39

[ECS 23rd Symposium on Microelectronics Technology and Devices - Gramado, Brazil (September 1 - September 4, 2008)] ECS Transactions - A New Methodology for Characterizing the Progressive BD of Hfo2/Sio2 Metal Gate Stacks

Pagano, Roberto, Lombardo, Salvatore, Palumbo, Felix R., Carloni, Stefania, Kirsch, Paul, Krishnan, Siddarth, Young, Chadwin, Choi, Rino, Bersuker, Gennadi, Stathis, James

Year:

2008

Language:

english

File:

PDF, 455 KB

english, 2008

40

[IEEE 2015 IEEE International Reliability Physics Symposium (IRPS) - Monterey, CA, USA (2015.4.19-2015.4.23)] 2015 IEEE International Reliability Physics Symposium - Analyzing path delays for accelerated testing of logic chips

Ray, Emily, Linder, Barry, Robertazzi, Raphael, Stawiasz, Kevin, Weger, Alan, Yashchin, Emmanuel, Stathis, James, Song, Peilin

Year:

2015

Language:

english

File:

PDF, 757 KB

english, 2015

41

Photoluminescence Characterization of Defects in Thermal Oxide

Nishikawa, Hiroyuki, Stathis, James H.

Journal:

MRS Proceedings

Year:

1999

Language:

english

File:

PDF, 679 KB

english, 1999

42

[IEEE 2016 IEEE International Reliability Physics Symposium (IRPS) - Pasadena, CA, USA (2016.4.17-2016.4.21)] 2016 IEEE International Reliability Physics Symposium (IRPS) - Fundamental statistical properties of reconstruction methodology for TDDB with variability in BEOL/MOL/FEOL applications

Wu, Ernest, Stathis, James, Li, Baozhen, Kim, Andrew, Linder, Barry, Bolam, Ronald, Bonilla, Griselda

Year:

2016

Language:

english

File:

PDF, 2.63 MB

english, 2016

43

[IEEE 2014 IEEE Symposium on VLSI Technology - Honolulu, HI, USA (2014.6.9-2014.6.12)] 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers - Spatial mapping of non-uniform time-to-breakdown and physical evidence of defect clustering

Wu, Ernest Y., Baozhen Li,, Stathis, James H., Linder, Barry, Shaw, Thomas

Year:

2014

Language:

english

File:

PDF, 676 KB

english, 2014

44

Oxygen-deficient centers and excess Si in buried oxide using photoluminescence spectroscopy

Nishikawa, Hiroyuki, Stahlbush, Robert E., Stathis, James H.

Journal:

Physical Review B

Year:

1999

Language:

english

File:

PDF, 139 KB

english, 1999

45

A Preliminary Case Series on the Use of Quetiapine for Posttraumatic Stress Disorder in Juveniles Within a Youth Detention Center

Stathis, Stephen, Martin, Graham, McKenna, James G.

Journal:

Journal of Clinical Psychopharmacology

Year:

2005

Language:

english

File:

PDF, 92 KB

english, 2005

46

Creating a comprehensive research strategy for cutaneous neurofibromas

Blakeley, Jaishri O., Wolkenstein, Pierre, Widemann, Brigitte C., Lee, James, Le, Lu Q., Jackson, Rhonda, Stathis, Marigo, Verma, Sharad K.

Journal:

Year:

2018

Language:

english

File:

PDF, 141 KB

english, 2018

47

Gene expression profiling of flaxseed in mouse lung tissues-modulation of toxicologically relevant genes

Floyd Dukes, Stathis Kanterakis, James Lee, Ralph Pietrofesa, Emily S Andersen, Evguenia Arguiri, Sonia Tyagi, Louise Showe, Yassine Amrani, Melpo Christofidou-Solomidou

Journal:

BMC Complementary and Alternative Medicine

Year:

2012

Language:

english

File:

PDF, 988 KB

english, 2012

48

[IEEE 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu, Taiwan (2014.4.28-2014.4.30)] Proceedings of Technical Program - 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - The resilience wall: Cross-layer solution strategies

Mitra, Subhasish, Bose, Pradip, Cheng, Eric, Cher, Chen-Yong, Cho, Hyungmin, Joshi, Rajiv, Kim, Young Moon, Lefurgy, Charles R., Li, Yanjing, Rodbell, Kenneth P., Skadron, Kevin, Stathis, James, Szafa

Year:

2014

Language:

english

File:

PDF, 1.77 MB

english, 2014

49

Physical Activity and Dimensions of Subjective Well-Being in Older Adults

Stathi, Aphrodite, Fox, Kenneth R., McKenna, James

Journal:

Journal of Aging and Physical Activity

Year:

2002

Language:

english

File:

PDF, 1.12 MB

english, 2002

50

William Gaddis

Stathis, James J.

Journal:

Critique Studies in Contemporary Fiction

Year:

1962

File:

PDF, 287 KB

1962

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